Record- low thermal boundary resistance of GaN-on-diamond structure with ultra-high bonding rate via surface reconstruction bonding technique
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Silicon Carbide Semiconductor Technologies
3D IC and TSV technologies
Publication details
- Journal / source
- Journal of Alloys and Compounds
- Volume
- 1057
- Pages
- 186906–186906
- Publication date
- 18 February 2026
- Language
- EN