Understanding composition–defect–performance relationships in InGaZnO TFTs via photo-induced current transient spectroscopy

Journal of Alloys and Compounds 2026

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Authors: Hyunmin Hong, Teklebrahan Gebrekrstos Weldemhret, Kwangsik Jeong, Kwun-Bum Chung

DOI: 10.1016/j.jallcom.2026.188086

Cited by: 1

References: 48

Fields of Study & Subjects

Thin-Film Transistor Technologies Ga2O3 and related materials Silicon Carbide Semiconductor Technologies

References 48