Optical response of phosphorus-doped GeOx thin films: Evidence of mid-infrared localized surface plasmon resonances
Fields of Study & Subjects
Silicon Nanostructures and Photoluminescence
Thin-Film Transistor Technologies
Semiconductor materials and devices
Publication details
- Journal / source
- Journal of Alloys and Compounds
- Publisher
- Elsevier BV
- Volume
- 1068
- Pages
- 188577–188577
- Publication date
- 1 May 2026
- Language
- EN