Optical response of phosphorus-doped GeOx thin films: Evidence of mid-infrared localized surface plasmon resonances

Read full text
Authors: Rosalie Nzang Mintsa, Xavier Devaux, M. Vergnat, Hervé Rinnert
Cited by: 1
References: 19

Fields of Study & Subjects

Silicon Nanostructures and Photoluminescence Thin-Film Transistor Technologies Semiconductor materials and devices

Publication details

Journal / source
Journal of Alloys and Compounds
Publisher
Elsevier BV
Volume
1068
Pages
188577–188577
Publication date
1 May 2026
Language
EN