Defect engineering-mediated OER-enhanced ECL for ultrasensitive detection of E.coli

Journal of Colloid and Interface Science 2026

View at publisher
Authors: Yiting Shao, Xuemei Wang, Hanxi Liu, Jianfei Xia, Feifei Zhang, Zonghua Wang
DOI: 10.1016/j.jcis.2026.140456
Cited by: 3
References: 35

Fields of Study & Subjects

Integrated Circuits and Semiconductor Failure Analysis Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques

Publication details

Journal / source
Journal of Colloid and Interface Science
Publisher
Elsevier BV
Volume
717
Pages
140456–140456
Publication date
4 April 2026
Language
EN