Stacking fault analysis for the early-stages of PVT growth of 4H-SiC crystals

Journal of Crystal Growth 2026

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Authors: Shanshan Hu, Ze Yu Chen, Kaixuan Zhang, Yuzhuo Li, Jianpei Zhang, Balaji Raghothamachar, Michael Dudley, Chuhang Liu, Yimei Zhu

DOI: 10.1016/j.jcrysgro.2026.128523

Cited by: 0

References: 18

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Advanced ceramic materials synthesis GaN-based semiconductor devices and materials

References 18