Dynamic background-guided asymmetric knowledge distillation network for 3D defect detection

Journal of Manufacturing Processes 2026

View at publisher

Authors: Fan Zhang, Wenlong Hu, Yun Wang, Ji'’an Duan

DOI: 10.1016/j.jmapro.2026.01.062

Cited by: 2

References: 14

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Infrastructure Maintenance and Monitoring

References 14