A magnetic flux leakage inversion model for rail white etching layer thickness integrating physical mechanism and data-driven approaches

Journal of Magnetism and Magnetic Materials 2026

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Authors: Kailun Ji, Longhui Xiong, Wei Yuan, Ping Wang, Jianjun Qu, Pan Liu

DOI: 10.1016/j.jmmm.2026.173884

Cited by: 1

References: 15

Fields of Study & Subjects

Magnetic Properties and Applications Non-Destructive Testing Techniques Magnetic properties of thin films

References 15