Atomic-scale determination of the crystal structure and a coherent interface of S2 silicide in a high-temperature titanium alloy

Journal of Materials Research and Technology 2026 Open access

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Authors: Bi-Ning Liang, Shuo Cao, Gang Zhou, Zhi-Cong Gan, Lei Wang, Wen-Yuan Li, Jian-Rong Liu, Qing‐Miao Hu
DOI: 10.1016/j.jmrt.2026.02.123
Cited by: 2
References: 38

Abstract

The S 2 silicide is a key precipitate strengthening high-temperature titanium alloys, yet its crystal structure and atomic level strengthening mechanisms remain unclear. Combining atomic-resolution scanning transmission electron microscopy (STEM) and first-principles calculations, we determine the atomic configuration of S 2 (space group ) in a high-temperature titanium alloy and identify a coherent interface with high adhesion strength (3.92 J/m 2 ). This work provides foundational atomic-scale insights into the intrinsic properties of the S 2 , offering a crucial guidance for the design of advanced high-temperature titanium alloys.

Fields of Study & Subjects

Semiconductor materials and interfaces Intermetallics and Advanced Alloy Properties Metallurgical and Alloy Processes

Publication details

Journal / source
Journal of Materials Research and Technology
Publisher
Elsevier BV
Volume
41
Pages
6184–6192
Publication date
24 February 2026
Language
EN