Spatio-temporal graph neural network based digital twin surrogate for throughput estimation in general assembly lines

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Authors: Muhammad Waseem, Changbai Tan, Seog‐Chan Oh, Jorge F. Arinez, Zijun Zhou, Qing Chang
Cited by: 1
References: 16

Fields of Study & Subjects

Assembly Line Balancing Optimization Machine Fault Diagnosis Techniques Digital Transformation in Industry

Publication details

Journal / source
Journal of Manufacturing Systems
Publisher
Elsevier BV
Volume
86
Pages
641–647
Publication date
6 April 2026
Language
EN