Event-triggered data-driven robust adaptive predictive control for the Czochralski silicon single crystal growth process

Journal of Process Control 2026 Open access

Read full text

Authors: Jun-Chao Ren, Ding Liu, Yinyin Li, Yin Chi Wan

DOI: 10.1016/j.jprocont.2026.103719

Cited by: 0

References: 19

Fields of Study & Subjects

Advanced Control Systems Optimization Fault Detection and Control Systems Advanced Statistical Process Monitoring

References 19