High-Resolution single particle analysis using a scintillator camera XF416 on CRYOARM300II at 300 kV

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Authors: Shinji Aramaki, Tomohito Tanihara, Yuya Yoshida, Naoya Matsunaga, Shigehiro Ohdo, Kouta Mayanagi
Cited by: 0
References: 19

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques Electron Spin Resonance Studies

Publication details

Journal / source
Journal of Structural Biology
Volume
218
Issue
1
Pages
108286–108286
Publication date
3 January 2026
Language
EN