High-Resolution single particle analysis using a scintillator camera XF416 on CRYOARM300II at 300 kV
Fields of Study & Subjects
Advanced Electron Microscopy Techniques and Applications
Electron and X-Ray Spectroscopy Techniques
Electron Spin Resonance Studies
Publication details
- Journal / source
- Journal of Structural Biology
- Volume
- 218
- Issue
- 1
- Pages
- 108286–108286
- Publication date
- 3 January 2026
- Language
- EN