Low-temperature/random-vibrations bias as an appropriate accelerated-test-vehicle for the outer-space electronics

Journal of Space Safety Engineering 2026

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Authors: Ephraim Suhir

DOI: 10.1016/j.jsse.2026.02.001

Cited by: 0

References: 19

Fields of Study & Subjects

Electronic Packaging and Soldering Technologies Integrated Circuits and Semiconductor Failure Analysis Reliability and Maintenance Optimization

References 19