SFFINet: A spatial frequency feature interaction method for few-shot chip surface defect segmentation

Knowledge-Based Systems 2026

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Authors: Hongyu Xiang, Jinan Gu, Jiayun Xiang, Zilin Xia, Yongmin Zhu, Wei Wang
DOI: 10.1016/j.knosys.2026.115769
Cited by: 3
References: 30

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Infrastructure Maintenance and Monitoring

Publication details

Journal / source
Knowledge-Based Systems
Publisher
Elsevier BV
Volume
340
Pages
115769–115769
Publication date
10 March 2026
Language
EN