A protocol for in-situ high resolution strain mapping at elevated temperature

Materials Characterization 2026 Open access

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Authors: D. Lunt, AD Smith, J.M. Donoghue, I. Alakiozidis, Thomas, R. K. (del.); Green, W. T. (sc.), EJ Pickering, P. Frankel, M. Carrington, B. Poole, C. Hardie, C. Hamelin, A. Harte
DOI: 10.1016/j.matchar.2026.116119
Cited by: 2
References: 37

Fields of Study & Subjects

Microstructure and mechanical properties Advanced Electron Microscopy Techniques and Applications Force Microscopy Techniques and Applications

Publication details

Journal / source
Materials Characterization
Publisher
Elsevier BV
Volume
233
Pages
116119–116119
Publication date
4 February 2026
Language
EN