High-precision detection method for micro-nano scale features of silicon nitride ceramics integrating dual-domain attention mechanism and weighted pyramid network

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Authors: Guanbiao Li, Shuping Huang, Haoyang Ren, Shuilin Rao, Dahai Liao, Leqi Jiang
Cited by: 0
References: 22

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Image Processing Techniques and Applications

Publication details

Journal / source
Materials Characterization
Volume
234
Pages
116200–116200
Publication date
26 February 2026
Language
EN