Grain engineering for low-temperature Cu/SiO₂ hybrid bonding: A microstructure-driven thermal expansion model
Fields of Study & Subjects
3D IC and TSV technologies
Advanced ceramic materials synthesis
Electronic Packaging and Soldering Technologies
Publication details
- Journal / source
- Materials Characterization
- Publisher
- Elsevier BV
- Volume
- 235
- Pages
- 116272–116272
- Publication date
- 14 March 2026
- Language
- EN