In-situ scanning electron microscopy investigations on the impact of ion irradiation on gold nanoparticles decorated FIB patterns in Si

Materials Characterization 2026

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Authors: Vikas Singh Gahlot, P. Jegadeesan, Sujoy Sen, Kishore Kumar Madapu, Ramanathaswamy Pandian, S. Amirthapandian

DOI: 10.1016/j.matchar.2026.116417

Cited by: 1

References: 46

Fields of Study & Subjects

Ion-surface interactions and analysis Advanced Electron Microscopy Techniques and Applications X-ray Spectroscopy and Fluorescence Analysis

References 46