Effect of thiourea concentration on DMF– Cu2NiSnS4 thin films: Comparative insights from optical, structural, surface, electrical and DFT analyses for photovoltaic applications

Materials Chemistry and Physics 2026

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Authors: T. Shalini, M. Sivasubramanian, P. Jagdish, I. Manimehan, S. Sakthivel
DOI: 10.1016/j.matchemphys.2026.132191
Cited by: 2
References: 47

Fields of Study & Subjects

Chalcogenide Semiconductor Thin Films Copper-based nanomaterials and applications Semiconductor materials and interfaces

Publication details

Journal / source
Materials Chemistry and Physics
Publisher
Elsevier BV
Volume
354
Pages
132191–132191
Publication date
12 February 2026
Language
EN