Impact of interface screening effect on imprint in epitaxial Nb-doped PZT thin films grown on silicon

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Authors: Minh Duc Nguyen, Thi Huynh Ho, Evert Pieter Houwman, H.N. Vu
Cited by: 1
References: 33

Fields of Study & Subjects

Ferroelectric and Piezoelectric Materials Advanced Sensor and Energy Harvesting Materials Ferroelectric and Negative Capacitance Devices

Publication details

Journal / source
Materials Chemistry and Physics
Publisher
Elsevier BV
Volume
364
Pages
132879–132879
Publication date
3 July 2026
Language
EN