Impact of interface screening effect on imprint in epitaxial Nb-doped PZT thin films grown on silicon
Fields of Study & Subjects
Ferroelectric and Piezoelectric Materials
Advanced Sensor and Energy Harvesting Materials
Ferroelectric and Negative Capacitance Devices
Publication details
- Journal / source
- Materials Chemistry and Physics
- Publisher
- Elsevier BV
- Volume
- 364
- Pages
- 132879–132879
- Publication date
- 3 July 2026
- Language
- EN