High-sensitivity and low-bias X-ray detectors enabled by high ion migration activation energy and reduced octahedral tilting
Fields of Study & Subjects
X-ray Spectroscopy and Fluorescence Analysis
Advanced Semiconductor Detectors and Materials
Crystallography and Radiation Phenomena
Publication details
- Journal / source
- Matter & Light
- Publisher
- Elsevier BV
- Volume
- 1
- Issue
- 2
- Pages
- 100028–100028
- Publication date
- 23 May 2026
- Language
- EN