Recent research progress of 4D-STEM from methodology to application in materials science

View at publisher
Authors: Bowen Liu, Zheng Hu, Pierre Ruterana, Ezra J. Olivier, Lin Gu, Yi Wang
Cited by: 2
References: 189

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Microstructure and mechanical properties Advanced X-ray Imaging Techniques

Publication details

Journal / source
Materials Today
Publisher
Elsevier BV
Volume
92
Pages
906–924
Publication date
1 January 2026
Language
EN