Measuring and prognosis of remaining useful life of light-emitting diodes based on nonlinear fuzzy inference system

Measurement 2026

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Authors: Quoc Tiep La, David Vališ, Zdeněk Vintr, Jakub Gajewski, Libor Žák, Kohl Zdeněk
DOI: 10.1016/j.measurement.2026.120322
Cited by: 1
References: 55

Fields of Study & Subjects

Reliability and Maintenance Optimization Industrial Vision Systems and Defect Detection Engineering and Test Systems

Publication details

Journal / source
Measurement
Publisher
Elsevier BV
Volume
264
Pages
120322–120322
Publication date
5 January 2026
Language
EN