Integrated memory-efficient framework for grain-level surface residual stress mapping via optical microscopy

Measurement 2026

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Authors: I Dewa Made Oka Dharmawan, Jinyi Lee

DOI: 10.1016/j.measurement.2026.120327

Cited by: 0

References: 24

Fields of Study & Subjects

Microstructure and mechanical properties Optical measurement and interference techniques Fatigue and fracture mechanics

References 24