Real-time adaptive scanning for atomic force microscopy using trigger-enhanced trajectory control

Measurement 2026

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Authors: Wanshuo Zhang, Lifeng Hao, Xiaodong He
DOI: 10.1016/j.measurement.2026.120347
Cited by: 1
References: 31

Fields of Study & Subjects

Force Microscopy Techniques and Applications Piezoelectric Actuators and Control Mechanical and Optical Resonators

Publication details

Journal / source
Measurement
Publisher
Elsevier BV
Volume
264
Pages
120347–120347
Publication date
7 January 2026
Language
EN