A comprehensive review of optical frequency-comb-based applications in surface metrology
Fields of Study & Subjects
Advanced Measurement and Metrology Techniques
Force Microscopy Techniques and Applications
Metal and Thin Film Mechanics
Publication details
- Journal / source
- Measurement
- Publisher
- Elsevier BV
- Volume
- 265
- Pages
- 120376–120376
- Publication date
- 10 January 2026
- Language
- EN