A comprehensive review of optical frequency-comb-based applications in surface metrology

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Authors: Thi Minh Thu Le, Hoang Nam Nguyen, Doan Tuan Phong Tran, Xuan Binh Cao
Cited by: 1
References: 132

Fields of Study & Subjects

Advanced Measurement and Metrology Techniques Force Microscopy Techniques and Applications Metal and Thin Film Mechanics

Publication details

Journal / source
Measurement
Publisher
Elsevier BV
Volume
265
Pages
120376–120376
Publication date
10 January 2026
Language
EN