ADAMNet: Improving imbalanced defect classification with Anomaly-Driven Attention Maps

Measurement 2026

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Authors: Jun-Hui Liang, Y.S. Gan, Sze‐Teng Liong, Shih-Yuan Wang, Yu-Ting Sheng, Lit-Ken Tan

DOI: 10.1016/j.measurement.2026.120537

Cited by: 1

References: 24

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Anomaly Detection Techniques and Applications Advanced Neural Network Applications

References 24