Evaluation of bulk and contact noise components with the Transfer Length Method: Model and experiment

Measurement 2026

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Authors: Piotr Knutel, Łukasz Ciura, Jacek Boguski, Jarosław Wróbel, Andrzej Kolek
DOI: 10.1016/j.measurement.2026.120580
Cited by: 0
References: 35

Fields of Study & Subjects

Semiconductor materials and interfaces Semiconductor materials and devices Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
Measurement
Volume
269
Pages
120580–120580
Publication date
3 February 2026
Language
EN