High-precision refractive index measurement system and method for solutions based on insertion-type spectral interferometry

Measurement 2026

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Authors: Xinyu An, Tong Guo, Yifu Wan

DOI: 10.1016/j.measurement.2026.120837

Cited by: 1

References: 7

Fields of Study & Subjects

Optical Polarization and Ellipsometry Optical Coherence Tomography Applications Digital Holography and Microscopy

References 7