End-to-end single-shot fringe projection profilometry based on semi-supervised learning

Measurement 2026

View at publisher
Authors: Huitao Wang, Lianpo Wang, Lianpo Wang
DOI: 10.1016/j.measurement.2026.121076
Cited by: 2
References: 61

Fields of Study & Subjects

Optical measurement and interference techniques Advanced Optical Sensing Technologies Image Processing Techniques and Applications

Publication details

Journal / source
Measurement
Publisher
Elsevier BV
Volume
272
Pages
121076–121076
Publication date
7 March 2026
Language
EN