General histogram test method applied to a wide range of signals for ADC linearity test

Measurement 2026

View at publisher

Authors: Cheng Ban, Jia Shen, Minshun Wu, Jian Xu, Li Geng, Degang Chen

DOI: 10.1016/j.measurement.2026.121086

Cited by: 2

References: 30

Fields of Study & Subjects

VLSI and Analog Circuit Testing Advanced Electrical Measurement Techniques Analog and Mixed-Signal Circuit Design

References 30