Multi-harmonic frequency-domain thermography for IC failure diagnosis: electrothermal nonlinearity modeling and phase-path criteria

Measurement 2026

View at publisher

Authors: Feng Yang, Fei Wang, Rongcheng Li, Stefano Sfarra, V.S. Ghali, V. Gopi Tilak, Ravibabu Mulaveesala, Honghao Yue, J. K. Liu

DOI: 10.1016/j.measurement.2026.121287

Cited by: 2

References: 19

Fields of Study & Subjects

Thermography and Photoacoustic Techniques Thermal properties of materials Silicon Carbide Semiconductor Technologies

References 19