LRTISS: a lightweight real-time network for industrial surface defect segmentation

Measurement 2026

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Authors: Zhiqian He, Yajun Chen, Zhujun zhang, Zequan Huang
DOI: 10.1016/j.measurement.2026.121410
Cited by: 2
References: 36

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Generative Adversarial Networks and Image Synthesis

Publication details

Journal / source
Measurement
Publisher
Elsevier BV
Volume
275
Pages
121410–121410
Publication date
4 April 2026
Language
EN