Combining artificial intelligence and deep learning to develop a mobile phone screen defect detection system

Measurement 2026 Open access

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Authors: S.K. Chen, Shin-Min Chao, Jagadish Barman, Ting-Wei Liao, Chih-Wei Chiu, Chung‐Feng Jeffrey Kuo

DOI: 10.1016/j.measurement.2026.121468

Cited by: 0

References: 31

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection

References 31