Automated detection and evaluation of internal stress in large sapphire crystals via conoscopic interference imaging and DynaDet-Net

Measurement 2026

View at publisher
Authors: Jixiang Zhao, Sen Kang, Tianhu Shi, Weitong Xu, Xin Liu, Xiaoyu Chen, Dong Pan, Jianqiao Meng, Yuxia Duan
DOI: 10.1016/j.measurement.2026.121570
Cited by: 1
References: 26

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Solidification and crystal growth phenomena Surface Roughness and Optical Measurements

Publication details

Journal / source
Measurement
Publisher
Elsevier BV
Volume
280
Pages
121570–121570
Publication date
14 May 2026
Language
EN