Epistemic uncertainty-guided partial optimal transport for source-free universal fault diagnosis

Measurement 2026

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Authors: Jin Chen, Jie Liu, Zongkuan Kang, Zhongxu Hu, Youmin Hu

DOI: 10.1016/j.measurement.2026.121602

Cited by: 1

References: 27

Fields of Study & Subjects

Fault Detection and Control Systems VLSI and Analog Circuit Testing Engineering and Test Systems

References 27