Temperature-dependent electrical breakdown model of solid dielectric materials based on the high-temperature fracture mechanics

View at publisher
Authors: Ruzhuan Wang, W. J. LI
Cited by: 2
References: 60

Fields of Study & Subjects

Dielectric materials and actuators Copper Interconnects and Reliability Dielectric properties of ceramics

Publication details

Journal / source
Mechanics of Materials
Publisher
Elsevier BV
Volume
215
Pages
105607–105607
Publication date
13 January 2026
Language
EN