Reliability testing and analysis of radiation-hardened Flash circuits packaged with bismuth-based coating

Microelectronics Journal 2026

View at publisher

Authors: Hongchao Zheng, Xiao Fang Bi, Tao Dong, Kai Cui, Yang Li, Yang Hong, Xiaohong Wu

DOI: 10.1016/j.mejo.2026.107053

Cited by: 0

References: 27

Fields of Study & Subjects

Radiation Effects in Electronics Silicone and Siloxane Chemistry Polymer Nanocomposite Synthesis and Irradiation

References 27