Learning-driven identification of fault-relevant test patterns for cost-efficient VLSI testing

Microelectronics Journal 2026

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Authors: Yamei Liu, Zhinan Li, Weijing Zhao, Haina Deng, Fei Zhang, Feng Hong

DOI: 10.1016/j.mejo.2026.107091

Cited by: 1

References: 9

Fields of Study & Subjects

VLSI and Analog Circuit Testing Physical Unclonable Functions (PUFs) and Hardware Security Integrated Circuits and Semiconductor Failure Analysis

References 9