Optimal design of constant stress accelerated degradation tests for high reliability chips

Microelectronics Journal 2026

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Authors: Shanyong Chen, Hanqing Luo, Delin Xu, Yuanfeng Xie, Liping Liang

DOI: 10.1016/j.mejo.2026.107099

Cited by: 0

References: 22

Fields of Study & Subjects

Reliability and Maintenance Optimization Software Reliability and Analysis Research Integrated Circuits and Semiconductor Failure Analysis

References 22