A low-power and leakage 14T SRAM cell with multinode upset tolerance for aerospace applications

Microelectronics Journal 2026

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Authors: Shuo Cai, Zhu Huang, Wei Shuai, Fei Yu

DOI: 10.1016/j.mejo.2026.107107

Cited by: 1

References: 27

Fields of Study & Subjects

Radiation Effects in Electronics Low-power high-performance VLSI design Physical Unclonable Functions (PUFs) and Hardware Security

References 27