Comparison of electromagnetic radiation in trench-gate and planar-gate SiC MOSFETs under TID radiation: A comprehensive study

Microelectronics Journal 2026

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Authors: Hongxin Zhang, Yunheng Li, Xiaofeng Wei, Lei Shu, Zhi Yu Sun, Yuanzhen Wang, Yejing Wu, Shichu Guan

DOI: 10.1016/j.mejo.2026.107116

Cited by: 0

References: 14

Fields of Study & Subjects

Radiation Effects in Electronics Silicon Carbide Semiconductor Technologies Fusion materials and technologies

References 14