Hybrid junction temperature prediction of IGBTs combining detailed electro-thermal modelling and deep learning regression

Microelectronics Journal 2026

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Authors: Mohammed Amin Benmahdjoub, Mekkaoui Mohammed, Mohamed Trabelsi, Meddah Atallah, Issam Salhi, Abdelkader Mezouar, Brahim Brahmi, Youcef Saidi
DOI: 10.1016/j.mejo.2026.107133
Cited by: 3
References: 26

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Advancements in Semiconductor Devices and Circuit Design Thermal properties of materials

Publication details

Journal / source
Microelectronics Journal
Publisher
Elsevier BV
Volume
172
Pages
107133–107133
Publication date
28 February 2026
Language
EN