An aging monitoring method of IGBT module bond wires based on active filter gain

Microelectronics Journal 2026 Open access

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Authors: Mingxing Du, Wei Han, Haiqing Gu

DOI: 10.1016/j.mejo.2026.107135

Cited by: 0

References: 21

Fields of Study & Subjects

Electromagnetic Compatibility and Noise Suppression Silicon Carbide Semiconductor Technologies Power Quality and Harmonics

References 21