A buffer layer based hardening strategy for SEB mitigation in high-voltage MOSFETs for space applications

Microelectronics Journal 2026

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Authors: Yanfei Zhang, Xueqin Gong, Ge Zhao, Xiaowu Cai, Mengxin Liu

DOI: 10.1016/j.mejo.2026.107146

Cited by: 1

References: 20

Fields of Study & Subjects

Radiation Effects in Electronics Semiconductor materials and devices Advancements in Semiconductor Devices and Circuit Design

References 20