Hotspot analysis and interface-state effect in SOI-FinFETs

Microelectronics Journal 2026 Open access

Read full text

Authors: Aolong Liu, Shuyuan Duan, Baoyi Hu, Zhaoliang Wang

DOI: 10.1016/j.mejo.2026.107248

Cited by: 0

References: 38

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design Semiconductor materials and devices Silicon Carbide Semiconductor Technologies

References 38