LOSTA: A low-overhead high-defect-detectability test-aware hardened latch with layout-aware short-defect modeling

Microelectronics Journal 2026

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Authors: Hui Xu, Ziqiang Zhao, Ruijun Ma, Stefan Holst, Sengling Wang, Huaguo Liang, Xiaoqing Wen

DOI: 10.1016/j.mejo.2026.107314

Cited by: 1

References: 17

Fields of Study & Subjects

Radiation Effects in Electronics VLSI and Analog Circuit Testing Low-power high-performance VLSI design

References 17