Towards the end of the ECSEL Project “iRel40”: three years of Intelligent Reliability

Microprocessors and Microsystems 2026

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Authors: Klas Brinkfeldt, Barıs Bulut, Federica Caruso, Tania Di Mascio, Leonardo Fazzini, Daniele Frigioni, Josef Moser, Vittoriano Muttillo, Luigi Pomante, Klaus Pressel, Sven Rzepka, Marco Santic
+4 more Müjdat Soytürk, Giacomo Valente, Willem Dirk van Driel, Susan Zhao
DOI: 10.1016/j.micpro.2026.105267
Cited by: 0
References: 8

Fields of Study & Subjects

Reliability and Maintenance Optimization Radiation Effects in Electronics Distributed systems and fault tolerance

Publication details

Journal / source
Microprocessors and Microsystems
Volume
122
Pages
105267–105267
Publication date
10 March 2026
Language
EN