Review of reliability of threshold voltage (Vth) extraction methods in silicon-based tunnel field effect transistors (TFETs)

Micro and Nanostructures 2026

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Authors: Vijaya Kumar K, Rithika R., Suresh Balanethiram, J. Indra

DOI: 10.1016/j.micrna.2025.208559

Cited by: 0

References: 27

Fields of Study & Subjects

Advancements in Semiconductor Devices and Circuit Design Semiconductor materials and devices Nanowire Synthesis and Applications

References 27