Real-time imaging quantification of mixed defective wheat kernels using a lightweight You Only Look Once version 8 instance-segmentation model

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Authors: Dianyang Sun, Weijie Lan, Kai Zhao, Kang Tu, Jun Liu, Leiqing Pan
Cited by: 0
References: 20

Fields of Study & Subjects

Smart Agriculture and AI Spectroscopy and Chemometric Analyses Industrial Vision Systems and Defect Detection

Publication details

Journal / source
Microchemical Journal
Volume
221
Pages
116820–116820
Publication date
4 January 2026
Language
EN