RAFT: A program for area fraction measurement of digital micrographs

Micron 2026

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Authors: M. Mika, P. McIntyre, Mary Sevart, ME Hurley, V.M. Miller, A. Aitkaliyeva
DOI: 10.1016/j.micron.2025.103984
Cited by: 1
References: 27

Fields of Study & Subjects

Electron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Digital Image Processing Techniques

Publication details

Journal / source
Micron
Publisher
Elsevier BV
Volume
203
Pages
103984–103984
Publication date
2 January 2026
Language
EN